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Home Achieving measurements to submicron level accuracies

Achieving measurements to submicron level accuracies

on: April 09, 2019In:
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Achieving measurements to submicron level accuracies

The EyeVision software by EVT now supports the FocalSpec 3D Line Confocal Scanner UULA, an automated optical 3D imaging and metrology system for submicron level accurate measurements on any material. 

It is a stand-alone system used in R&D laboratories, smart manufacturing, and quality control. 

Line Confocal Imaging (LCI) technology used in UULA enables users to model the most demanding surfaces and shapes, even mirror-like, curved and transparent objects. UULA’s LCI sensor detects millions of 3D points per second, and it can distinguish irregularities of less than one micron. The UULA consists of a light source and a CMOS array which are arranged in an angle to each other.

The EyeVision software can carry out different measurements on the captured point cloud and profile. The Metrology command set as well as the 3D Profile commands can be applied to the scans. The Profile Match command for example can compare previously configured profiles with the scanned profile and therefore can detect defect profiles.

Compared to the old measuring methods, with the special 3D technology ‘Line Confocal Imaging (LCI)’ laboratory level accuracy is said to be achievable in an industrial environment. The LCI technology delivers accurate data and high-resolution 3D imaging of metal, glass, paper or plastic surfaces.

The LCI delivers automated, high-speed and high-precision scans of challenging surfaces and shapes, such as mirror-like, curved or multi-layered transparent objects.

The UULA can measure 3D topography and dimensions. It can make tomographic imaging of transparent objects as well as high-precision 2D imaging with extended sharp focus range.

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Source: Control Engineering Europe - All Articles
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